Experiments on aliasing in signature analysis registers

TitleExperiments on aliasing in signature analysis registers
Publication TypeConference Paper
Year of Publication1989
AuthorsXavier, D., R. C. Aitken, A. Ivanov, and V. K. Agarwal
Conference NameTest Conference, 1989. Proceedings. Meeting the Tests of Time., International
Pagination344 -354
Date Publishedaug.
Keywordsasymmetric error model, BIST, conditional probability, cost, error statistics, fault classification, fault-free bit, independent error model, logic testing, probability, probability of aliasing, shift registers, signature analysis registers, subdivision of faults

An effort is made to validate experimentally predictions on aliasing in signature analysis registers under the independent error model. From the experimental results it appears that the independent error model accurately predicts the probability of aliasing in signature registers. The authors also provide justification for the adoption of a more general asymmetric error model of which the former is a special case; the latter can be used at no extra cost. Among the potential benefits in using the asymmetric error model is the subdivision of faults into classes based on pD and pDbar, the conditional probability, respectively, of the fault-free bit being 1 and the faulty bit being 0 and vice versa, whereby faults in a given class have the same probability of aliasing. Under the independent error model fault classification is based on a single parameter p. Use of an asymmetric model hence provides a better resolution in terms of the classification of faults based on aliasing probability. Experimental results also indicate that considering the asymmetric nature of circuit outputs yields more useful information, especially in the dynamic region of the aliasing curve


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