A built-in current sensor for testing analog circuit blocks

TitleA built-in current sensor for testing analog circuit blocks
Publication TypeConference Paper
Year of Publication1999
AuthorsTabatabaei, S., and A. Ivanov
Conference NameInstrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Pagination1403 -1408 vol.3
Keywords0.5 micron, analog circuit block testing, BIC sensor, built-in current sensor, built-in self test, circuit optimisation, circuit performance tradeoffs, CMOS analogue integrated circuits, CMOS technology, electric current measurement, electric sensing devices, high current measurement sensitivity, IDD testing, integrated circuit testing, optimization guidelines, supply current testing

A built-in current (BIC) sensor circuit is proposed for supply current (IDD) testing of analog circuits. The BIC sensor provides high current measurement sensitivity without introducing a large impedance in the IDD path. The circuit has been implemented using a standard 0.5 mu;m CMOS technology. Circuit performance trade-offs are analyzed and optimization guidelines provided for various applications. Simulation and measurement results are also included


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