Dedicated autonomous scan-based testing (DAST) for embedded cores

TitleDedicated autonomous scan-based testing (DAST) for embedded cores
Publication TypeConference Paper
Year of Publication2002
AuthorsNahvi, M., A. Ivanov, and R. Saleh
Conference NameTest Conference, 2002. Proceedings. International
Pagination1176 - 1183
KeywordsATE resources, automatic test equipment, boundary scan testing, dedicated autonomous scan-based testing, embedded autonomous sequencers, embedded cores, functionality, integrated circuit testing, logic testing, multiple embedded cores, SoC benchmarks, system-on-chip, test data communication, test data control

The complexity of today's chips is such that relying solely upon external ATE resources is insufficient for scan test. In this work, we develop the concept of dedicated autonomous scan-based testing (DAST) by proposing a scheme that introduces hierarchy and separates the functionality of ATE resources into two distinctive classes: a) test data communication, and b) test data control and observation. To simplify the ATE for embedded digital core testing, we propose transferring ATE test data control/observation functions to one or more Embedded Autonomous Sequencers (EAS) dedicated to single or multiple embedded cores of an SoC We present implementation results of our DAST methodology when applied to a number of SoC benchmarks.


a place of mind, The University of British Columbia

Electrical and Computer Engineering
2332 Main Mall
Vancouver, BC Canada V6T 1Z4
Tel +1.604.822.2872
Fax +1.604.822.5949

Emergency Procedures | Accessibility | Contact UBC | © Copyright 2021 The University of British Columbia