Title | Computation of exact fault coverage for compact testing schemes |
Publication Type | Conference Paper |
Year of Publication | 1991 |
Authors | Lambidonis, D., V. K. Agarwal, A. Ivanov, and D. Xavier |
Conference Name | Circuits and Systems, 1991., IEEE International Sympoisum on |
Pagination | 1873 -1876 vol.3 |
Date Published | jun. |
Keywords | built-in self test, compact testing schemes, computerised signal processing, dynamic programming, exact fault coverage computation, intermediate signatures, logic testing, optimal scheduling |
Abstract | A strategy based on the use of intermediate signatures is developed that enables the exact fault coverage of compact testing schemes to be determined in a feasible computation time. A model is developed to predict fault simulation time, and used along with a dynamic programming based algorithm to find the optimal scheduling of the signatures with respect to the total simulation time. A more sophisticated model which uses preliminary fault simulation results to make better estimations is also introduced. Simulation results for both models are presented demonstrating the feasibility of the strategy |
URL | http://dx.doi.org/10.1109/ISCAS.1991.176772 |
DOI | 10.1109/ISCAS.1991.176772 |