Characterization of the Displacement Tolerance of QCA Interconnects

TitleCharacterization of the Displacement Tolerance of QCA Interconnects
Publication TypeConference Paper
Year of Publication2008
AuthorsKarim, F., and K. Walus
Conference NameDesign and Test of Nano Devices, Circuits and Systems, 2008 IEEE International Workshop on
Pagination49 -52
Date Publishedsep.
Keywordscell displacements, cellular automata, coherence vector formalism, displacement tolerance, integrated circuit interconnections, molecular electronics, nanoelectronics, nanoscale devices, numerical simulations, QCA interconnect, quantum dots, quantum-dot cellular automata interconnect

Quantum-dot cellular automata (QCA) is one of several emerging nanoscale devices that is targeted at scalable molecular electronics. In this paper, the tolerance to cell displacements of a QCA interconnect is analyzed in order to determine limits on allowable displacements, as well as to identify the important failure mechanisms. Numerical simulations using the coherence vector formalism are performed for a short length of QCA interconnect under various conditions. Contrary to previous work, our results indicate that wider interconnects display a higher sensitivity to cell displacements due to the formation of cell clusters, which are more prominent in wider interconnects as a result of the increased number of cells.


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