Count-based BIST compaction schemes and aliasing probability computation

TitleCount-based BIST compaction schemes and aliasing probability computation
Publication TypeJournal Article
Year of Publication1992
AuthorsIvanov, A., and Y. Zorian
JournalComputer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Pagination768 -777
Date Publishedjun.
Keywordsaliasing probability computation, BIST compaction schemes, built-in self test, count-based compaction, error models, fault detection probabilities, finite test sequence lengths, Markov model, Markov processes, probability, unified probabilistic model

The authors present a unified probabilistic model of count-based compaction that relates the probability of occurrence of the counted events to a circuit's fault detection probabilities. This model allows an identical treatment of all the different count-based techniques proposed to date, e.g. ones, transitions, edges, and spectral coefficients, by essentially reducing all techniques to simple ones-counting. From a Markov model of ones-counting, the authors derive asymptotic aliasing probabilities, and for finite test sequence lengths they developed a computation technique for determining the aliasing associated with the specifically mentioned schemes, as well as more general count-based compaction techniques, under various error models


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