A DDJ calibration methodology for high-speed test and measurement equipments

TitleA DDJ calibration methodology for high-speed test and measurement equipments
Publication TypeConference Paper
Year of Publication2005
AuthorsFarahmand, T., S. Tabatabaei, F. Ben-Zeev, and A. Ivanov
Conference NameTest Conference, 2005. Proceedings. ITC 2005. IEEE International
Pagination10 pp. -217
Date Publishednov.
Keywordsautomatic test pattern generation, calibration, data pattern, data-dependent jitter, DDJ calibration, DUT, high-speed integrated circuits, high-speed serial data signals, high-speed test, integrated circuit testing, jitter, measurement equipments, physical transmission medium, test fixture

Data-dependent jitter (DDJ) occurs when transmitting high-speed serial data signals through physical transmission medium. In test applications, the DDJ due to the test fixture and measurement equipment may be significant relative to the jitter under measurement. To avoid the loss of accuracy, special calibration methodologies are required to reduce the DDJ impact from test fixtures. This paper describes a novel technique for DDJ calibration for cases where signal pulse shape does not vary significantly from DUT to DUT. This method uses the signal history prior to each transition to estimate the test fixture induced DDJ and compensates for it regardless of data pattern or bit rate. We also introduce a new technique for separating the DDJ due to long-term history (in long transmission lines) from that of the short-term history preceding a transition


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