Minimal hardware multiple signature analysis for BIST

TitleMinimal hardware multiple signature analysis for BIST
Publication TypeConference Paper
Year of Publication1993
AuthorsWu, Y., and A. Ivanov
Conference NameVLSI Test Symposium, 1993. Digest of Paper s., Eleventh Annual 1993 IEEE
Pagination17 -20
Date Publishedapr.
Keywordsaliasing, BIST multiple intermediate signature analysis, built-in self test, fault-free output sequence, Integrated logic circuits, logic testing, nonrecurring CPU time expenditure, recurring silicon area savings
Abstract

Proposes a new BIST multiple intermediate signature analysis scheme which checks n signatures against a single reference. Therefore, the circuitry for checking n signatures is essentially the same as that for checking one signature. The scheme is based on a manipulation of the CUT's fault-free output sequence. No circuit modification is required. The cost for implementing the scheme is a small nonrecurring CPU time expenditure in the design phase. In return, the scheme yields significant recurring silicon area savings, and reduced aliasing

URLhttp://dx.doi.org/10.1109/VTEST.1993.313314
DOI10.1109/VTEST.1993.313314

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