A fuzzy multiple signature compaction scheme for BIST

TitleA fuzzy multiple signature compaction scheme for BIST
Publication TypeConference Paper
Year of Publication1992
AuthorsWu, Y., and A. Ivanov
Conference NameTest Symposium, 1992. (ATS '92), Proceedings., 1st Asian (Cat. No.TH0458-0)
Pagination247 -252
Date Publishednov.
Keywordsaliasing, BIST, built-in self test, fault diagnosability, fault location, fuzzy logic, fuzzy multiple signature compaction, logic testing, signal processing, simulation, test-time
Abstract

Compared to single signature analysis, checking multiple signatures yields smaller aliasing, easier fault coverage computation, shorter average test-time, and increased fault diagnosability. In conventional multiple signature (CMS) schemes, for a CUT to be declared good, at each check point, the signature obtained must match a specific reference. This strict one-to-one correspondence makes the CMS scheme complex to implement and expensive in terms of silicon area. The authors propose a fuzzy multiple signature compaction scheme in which the requirement for the one-to-one correspondence is removed. In the FMS scheme, for a CUT to be declared good, it suffices that the signature obtained at each check point correspond to any of a set of references

URLhttp://dx.doi.org/10.1109/ATS.1992.224400
DOI10.1109/ATS.1992.224400

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