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| Title | A current integrator for BIST of mixed-signal ICs |
| Publication Type | Conference Paper |
| Year of Publication | 1999 |
| Authors | Tabatabaei, S., and A. Ivanov |
| Conference Name | VLSI Test Symposium, 1999. Proceedings. 17th IEEE |
| Pagination | 311 -318 |
| Keywords | 0.5 micron, 72 pF, average supply current, BIST, built-in current integrator, built-in self test, circuit optimisation, circuit performance trade-off, CMOS integrated circuits, CMOS technology, comparator, current signature generator, digital signature, embedded circuit blocks, integrating circuits, mixed analogue-digital integrated circuits, mixed-signal ICs, optimization guidelines, power monitor |
| Abstract | A novel built-in current integrator (BICI) is proposed for measuring the average supply current (IDD) of embedded circuit blocks. Such a circuit can be used both as a current signature generator and power monitor. The BICI uses only small capacitors (total 72 pF), a simple comparator, 7 switches, and a counter to perform integration over a long time (1 ms) window and digitize IDD. The BICI generates a digital signature proportional to IDD and occupies a small area which make it suitable for BIST applications on mixed-signal ICs. The circuit has been implemented using a standard 0.5 mu; CMOS technology. Circuit performance trade-offs are analyzed and optimization guidelines provided. Simulation results are also included |
| URL | http://dx.doi.org/10.1109/VTEST.1999.766681 |
| DOI | 10.1109/VTEST.1999.766681 |