A built-in current sensor for testing analog circuit blocks

TitleA built-in current sensor for testing analog circuit blocks
Publication TypeConference Paper
Year of Publication1999
AuthorsTabatabaei, S., and A. Ivanov
Conference NameInstrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Pagination1403 -1408 vol.3
Keywords0.5 micron, analog circuit block testing, BIC sensor, built-in current sensor, built-in self test, circuit optimisation, circuit performance tradeoffs, CMOS analogue integrated circuits, CMOS technology, electric current measurement, electric sensing devices, high current measurement sensitivity, IDD testing, integrated circuit testing, optimization guidelines, supply current testing
Abstract

A built-in current (BIC) sensor circuit is proposed for supply current (IDD) testing of analog circuits. The BIC sensor provides high current measurement sensitivity without introducing a large impedance in the IDD path. The circuit has been implemented using a standard 0.5 mu;m CMOS technology. Circuit performance trade-offs are analyzed and optimization guidelines provided for various applications. Simulation and measurement results are also included

URLhttp://dx.doi.org/10.1109/IMTC.1999.776039
DOI10.1109/IMTC.1999.776039

a place of mind, The University of British Columbia

Electrical and Computer Engineering
2332 Main Mall
Vancouver, BC Canada V6T 1Z4
Tel +1.604.822.2872
Fax +1.604.822.5949
Email:

Emergency Procedures | Accessibility | Contact UBC | © Copyright 2020 The University of British Columbia