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| Title | A built-in current monitor for testing analog circuit blocks |
| Publication Type | Conference Paper |
| Year of Publication | 1999 |
| Authors | Tabatabaei, S., and A. Ivanov |
| Conference Name | Circuits and Systems, 1999. ISCAS '99. Proceedings of the 1999 IEEE International Symposium on |
| Pagination | 109 -114 vol.2 |
| Date Published | jul. |
| Keywords | analog circuit block testing, BIST applications, built-in current monitor, built-in self test, current integrator circuit, digital signature generation, electric current measurement, embedded analog circuits, high current measurement sensitivity, integrated circuit testing, integrating circuits, mixed analogue-digital integrated circuits, mixed-signal ICs, monitoring, supply current measurement |
| Abstract | A novel built-in current (BIC) monitor circuit is proposed for supply current (IDD) measurement and testing of embedded analog circuits. The BIC monitor provides high current measurement sensitivity without introducing a large impedance in the IDD path. It also includes a current integrator circuit which generates a digital signature proportional to the average IDD (I macr; D macr;D macr;). The integrator uses only small capacitors (totaling 74 pF), 4 comparators, 14 switches and a counter to perform integration over a long time (1 ms) window and to digitize I macr; D macr;D macr;. The monitor occupies a small area and is suitable for BIST applications on mixed-signal ICs |
| URL | http://dx.doi.org/10.1109/ISCAS.1999.780631 |
| DOI | 10.1109/ISCAS.1999.780631 |