CMOS differential and absolute thermal sensors

TitleCMOS differential and absolute thermal sensors
Publication TypeJournal Article
Year of Publication2002
AuthorsSyal, A., V. Lee, A. Ivanov, and J. Altet
JournalJournal of Electronic Testing-Theory and Applications
Volume18
Pagination295–304
ISSN0923-8174
Abstract

This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors have been implemented in a standard .18 mum CMOS technology.

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