CMOS differential and absolute thermal sensors

TitleCMOS differential and absolute thermal sensors
Publication TypeConference Paper
Year of Publication2001
AuthorsSyal, A., V. Lee, I. Andre, and J. Altet
Conference NameOn-Line Testing Workshop, 2001. Proceedings. 7th International
Pagination127 -132
Keywords0.18 micron, CMOS digital IC testing, CMOS digital integrated circuits, differential temperature sensor, integrated circuit testing, proportional to absolute temperature sensor, Si, silicon surface, temperature sensors, thermal mapping

This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors are small, robust, effective, and operate without affecting the circuit performance. The sensors have been implemented in a standard .18 mu;m CMOS technology


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