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| Title | CMOS differential and absolute thermal sensors |
| Publication Type | Conference Paper |
| Year of Publication | 2001 |
| Authors | Syal, A., V. Lee, I. Andre, and J. Altet |
| Conference Name | On-Line Testing Workshop, 2001. Proceedings. 7th International |
| Pagination | 127 -132 |
| Keywords | 0.18 micron, CMOS digital IC testing, CMOS digital integrated circuits, differential temperature sensor, integrated circuit testing, proportional to absolute temperature sensor, Si, silicon surface, temperature sensors, thermal mapping |
| Abstract | This paper treats the test of CMOS digital ICs by using the thermal mapping of the silicon surface as a test observable. Two different temperature-sensing strategies are presented. The novel sensors developed are an on-chip CMOS Differential Temperature (DT) sensor and a Proportional to Absolute Temperature (PTAT) sensor. The sensors are small, robust, effective, and operate without affecting the circuit performance. The sensors have been implemented in a standard .18 mu;m CMOS technology |
| URL | http://dx.doi.org/10.1109/OLT.2001.937832 |
| DOI | 10.1109/OLT.2001.937832 |