Title | Effects of doping on structural change and hydrogen bonding in laser crystallized polycrystalline silicon films |
Publication Type | Journal Article |
Year of Publication | 2007 |
Authors | Saleh, R., and N. H. Nickel |
Journal | Thin Solid Films |
Volume | 515 |
Pagination | 3847-3853 |
Date Published | FEB 26 |
Type of Article | Article |
ISSN | 0040-6090 |
Keywords | doped polycrystalline silicon, hydrogen bonding, hydrogen density-of-states, hydrogen effusion, laser crystallization, Raman spectroscopy |
Abstract | Doped polycrystalline silicon films were produced by employing a step-by-step laser crystallization of doped hydrogenated amorphous silicon (a-Si:H). The influence of laser crystallization on structural properties and hydrogen bonding were investigated using Raman backscattering spectroscopy and hydrogen effusion measurements. Crystallization with low laser fluence, E-L, results a stratified structure with polycrystalline silicon layer at the top of an amorphous layer. In fully crystallized polycrystalline silicon the Raman lines in both P- and B-doped specimens are asymmetric, which is indicative of the Fano effect. From the hydrogen effusion spectra, the hydrogen density-of-states distribution is derived. Laser crystallization results in an increase of the hydrogen binding energy by about 0.2-0.3 eV compared to the amorphous starting material. (c) 2006 Elsevier B.V. All rights reserved. |
URL | http://dx.doi.org/10.1016/j.tsf.2006.10.105%7D |
DOI | 10.1016/j.tsf.2006.10.105 |