Scanning electron microscopy of field-emitting individual single-walled carbon nanotubes

TitleScanning electron microscopy of field-emitting individual single-walled carbon nanotubes
Publication TypeJournal Article
Year of Publication2004
AuthorsNojeh, A., W. - K. Wong, A. W. Baum, F. R. Pease, and H. Dai
JournalApplied Physics Letters
Volume85
Pagination112 -114
Date Publishedjul.
ISSN0003-6951
Keywordscarbon nanotubes, electron field emission, scanning electron microscopy
Abstract

Carbon nanotubes are promising electron emitters because of their sharp geometries that lead to significant external field enhancement, as well as their mechanical strength. However, distinguishing the emission due to an individual single-walled carbon nanotube (SWCNT) from that due to surrounding structures is a challenge. Here, we demonstrate how a scanning electron microscope (SEM) can be used to view the emission from individual SWCNTs by applying an external field close to the onset of field-emission and then scanning the tube with the electron beam of the SEM. The stimulated emission is revealed in the SEM image as localized bright spots.

URLhttp://dx.doi.org/10.1063/1.1763984
DOI10.1063/1.1763984

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