Advances in VLSI Testing at MultiGbps Rates - Introduction

TitleAdvances in VLSI Testing at MultiGbps Rates - Introduction
Publication TypeJournal Article
Year of Publication2004
AuthorsIvanov, A., F. Lombardi, and C. Metra
JournalIEEE Design & Test of Computers
Volume21
Pagination274–276
ISSN0740-7475

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