Title | Computing the error escape probability in count-based compaction schemes |
Publication Type | Conference Paper |
Year of Publication | 1990 |
Authors | Ivanov, A., and Y. Zorian |
Conference Name | Computer-Aided Design, 1990. ICCAD-90. Digest of Technical Paper s., 1990 IEEE International Conference on |
Pagination | 368 -371 |
Date Published | nov. |
Keywords | circuit layout CAD, count-based compaction schemes, error escape, error escape probability computing, fault detection, fault location, spectral coefficients, unified probabilistic model |
Abstract | A unified probabilistic model of count-based compaction is presented that relates the probability of occurrence of the `counted' events to a circuit's fault detection probabilities. This model enables an identical treatment to be made of all the different count-based techniques proposed to date, e.g., ones, transitions, edges, and spectral coefficients. Based on this model, the authors propose a computation technique for determining the error escape associated with these specific, as well as more general, count-based compaction techniques, under various error models |
URL | http://dx.doi.org/10.1109/ICCAD.1990.129927 |
DOI | 10.1109/ICCAD.1990.129927 |