Computing the error escape probability in count-based compaction schemes

TitleComputing the error escape probability in count-based compaction schemes
Publication TypeConference Paper
Year of Publication1990
AuthorsIvanov, A., and Y. Zorian
Conference NameComputer-Aided Design, 1990. ICCAD-90. Digest of Technical Paper s., 1990 IEEE International Conference on
Pagination368 -371
Date Publishednov.
Keywordscircuit layout CAD, count-based compaction schemes, error escape, error escape probability computing, fault detection, fault location, spectral coefficients, unified probabilistic model
Abstract

A unified probabilistic model of count-based compaction is presented that relates the probability of occurrence of the `counted' events to a circuit's fault detection probabilities. This model enables an identical treatment to be made of all the different count-based techniques proposed to date, e.g., ones, transitions, edges, and spectral coefficients. Based on this model, the authors propose a computation technique for determining the error escape associated with these specific, as well as more general, count-based compaction techniques, under various error models

URLhttp://dx.doi.org/10.1109/ICCAD.1990.129927
DOI10.1109/ICCAD.1990.129927

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