Reducing Post-Silicon Coverage Monitoring Overhead with Emulation and Bayesian Feature Selection

TitleReducing Post-Silicon Coverage Monitoring Overhead with Emulation and Bayesian Feature Selection
Publication TypeConference Paper
Year of Publication2015
AuthorsGallardo, R. O., A. J. Hu, A. Ivanov, and M. S. Mirian
Conference NameProceedings of the IEEE/ACM International Conference on Computer-Aided Design
Pagination816–823
PublisherIEEE Press

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