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| Title | On multiple fault coverage and aliasing probability measures |
| Publication Type | Conference Paper |
| Year of Publication | 1988 |
| Authors | Cox, H., A. Ivanov, V. K. Agarwal, and J. Rajski |
| Conference Name | Test Conference, 1988. Proceedings. New Frontiers in Testing, International |
| Pagination | 314 -321 |
| Date Published | sep. |
| Keywords | aliasing probability, electronic equipment testing, fault location, Integrated logic circuits, interpreted logic circuits, logic testing, multiple fault coverage, probability |
| Abstract | A comparative study is presented of different methods of calculating multiple fault coverage and aliasing probability measures. The objectives are to describe the ways that these ratios are defined to give them a physical interpretation, and to separate the discussion of how to define the measure from how the measure might be actually obtained or calculated. The interpretation, accuracy, and applicability of the measures are discussed |
| URL | http://dx.doi.org/10.1109/TEST.1988.207817 |
| DOI | 10.1109/TEST.1988.207817 |