On multiple fault coverage and aliasing probability measures

TitleOn multiple fault coverage and aliasing probability measures
Publication TypeConference Paper
Year of Publication1988
AuthorsCox, H., A. Ivanov, V. K. Agarwal, and J. Rajski
Conference NameTest Conference, 1988. Proceedings. New Frontiers in Testing, International
Pagination314 -321
Date Publishedsep.
Keywordsaliasing probability, electronic equipment testing, fault location, Integrated logic circuits, interpreted logic circuits, logic testing, multiple fault coverage, probability
Abstract

A comparative study is presented of different methods of calculating multiple fault coverage and aliasing probability measures. The objectives are to describe the ways that these ratios are defined to give them a physical interpretation, and to separate the discussion of how to define the measure from how the measure might be actually obtained or calculated. The interpretation, accuracy, and applicability of the measures are discussed

URLhttp://dx.doi.org/10.1109/TEST.1988.207817
DOI10.1109/TEST.1988.207817

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