An all-digital DFT scheme for testing catastrophic faults in PLLs

TitleAn all-digital DFT scheme for testing catastrophic faults in PLLs
Publication TypeJournal Article
Year of Publication2003
AuthorsAzais, F., Y. Bertrand, M. Renovell, A. Ivanov, and S. Tabatabaei
JournalIEEE Design & Test of Computers
Volume20
Pagination60–67
ISSN0740-7475
Abstract

Traditional functional testing of mixed-signal ICs is slow and requires costly, dedicated test equipment. The authors update the standard PLL architecture to allow simple digital testing. The all-digital strategy yields catastrophic fault coverage as high as that of the classical functional test, plus it is fast, extremely simple to implement and requires only standard digital test equipment.

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