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"Trends in low power digital System-On-Chip designs",
PROCEEDING OF THE 2002 3RD INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN, 10662 LOS VAQUEROS CIRCLE, PO BOX 3014, LOS ALAMITOS, CA 90720-1264 USA, IEEE Tech Comm VLSI Design; IEEE Comp Soc Tech Comm Design Automat; IEEE Comp Soc Test Technol Tech Council; IEEE Electron Devices Soc; Fabless Semicond Assoc; ACM/sigDA, pp. 373-378, 2002.
Abstract
"Silicon-hydrogen bonds in boron and phosphorous doped polycrystalline silicon thin films",
AMORPHOUS AND NANOCRYSTALLINE SILICON SCIENCE AND TECHNOLOGY- 2004, vol. 808, 506 KEYSTONE DRIVE, WARRENDALE, PA 15088-7563 USA, Mat Res Soc, pp. 289-294, 2004.
Abstract
"Infrared and hydrogen effusion studies of amorphous silicon carbon (a-Si : C : H) films prepared by DC magnetron sputtering (DCMS)",
International Journal of Modern Physics B, vol. 16, no. 6-7, JOURNAL DEPT PO BOX 128 FARRER ROAD, SINGAPORE 912805, SINGAPORE, Mat Res Soc; Int Union Mat Res Soc, pp. 1110-1114, MAR 20, 2002.
Abstract
"NONEQUILIBRIUM CARRIERS IN A-SI-H EXCITED BY DEFECT ABSORPTION",
Journal of Non-Crystanlline Solids, vol. 166, no. Part 1, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, IUPAP; HITACHI LTD; FUJI ELECT CO LTD; INT COMMUN SPECIALISTS; BNR STL; TAYLOR & FRANCIS LTD; INST MAT; INST ELECT ENGINEERS; INT SCI FDN; WELSH DEV AGCY; SANYO ELECT CO LTD; KANEKA CORP; OXFORD INSTRUMENTS LTD; ICI ZENECA; IBM US; INST PHYS; ROYAL SOC; B, pp. 563-566, DEC, 1993.
Abstract
"Clock skew verification in the presence of IR-drop in the power distribution network",
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 19, no. 6, 345 E 47TH ST, NEW YORK, NY 10017-2394 USA, IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, pp. 635-644, JUN, 2000.
Abstract
"Raman spectroscopy of doped and compensated laser crystallized polycrystalline silicon thin films",
Surface & Coatings Technology, vol. 198, no. 1-3, PO BOX 564, 1001 LAUSANNE, SWITZERLAND, ELSEVIER SCIENCE SA, pp. 143-147, AUG 1, 2005.
Abstract
"System-on-Chip: Reuse and Integration",
Proceedings of the IEEE, vol. 94, no. 6, pp. 1050 -1069, jun., 2006.
Abstract
"Helium effusion measurements for studying the microstructure of a-SiC : H films deposited by d.c. sputtering",
Diamond and Related Materials, vol. 12, no. 10-11, PO BOX 564, 1001 LAUSANNE, SWITZERLAND, ELSEVIER SCIENCE SA, pp. 1927-1931, OCT-NOV, 2003.
Abstract
"Laser crystallization of compensated hydrogenated amorphous silicon thin films",
Journal of Non-Crystanlline Solids, vol. 352, no. 9-20, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, ELSEVIER SCIENCE BV, pp. 1003-1007, JUN 15, 2006.
Abstract
"AMORPHOUS-SILICON THIN-FILM TRANSISTORS WITH NONUNIFORM DISTRIBUTION OF GAP STATES",
AMORPHOUS SILICON TECHNOLOGY - 1991, vol. 219: MAT RES SOC, pp. 339-344, 1991.
"Structural and electrical characterization of b-doped microcrystalline silicon thin films",
AMORPHOUS AND HETEROGENEOUS SILICON-BASED FILMS-2002, vol. 715, 506 KEYSTONE DRIVE, WARRENDALE, PA 15088-7563 USA, Mat Res Soc, pp. 327-332, 2002.
Abstract
"Excimer laser crystallized phosphorous-doped polycrystalline silicon",
Journal of Non-Crystanlline Solids, vol. 338, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, ELSEVIER SCIENCE BV, pp. 143-146, JUN 15, 2004.
Abstract
"Effects of doping on structural change and hydrogen bonding in laser crystallized polycrystalline silicon films",
Thin Solid Films, vol. 515, no. 7-8, PO BOX 564, 1001 LAUSANNE, SWITZERLAND, ELSEVIER SCIENCE SA, pp. 3847-3853, FEB 26, 2007.
Abstract
"PHOTOLUMINESCENCE AND LIGHT-INDUCED ESR IN A-SI-H STUDIED WITH SUBGAP EXCITATION",
AMORPHOUS SILICON TECHNOLOGY-1993, vol. 297, 9800 MCKNIGHT RD, SUITE 327, PITTSBURGH, PA 15237, MAT RES SOC; ELECT POWER INST; ELETTRORAVA SPA; ENTE NAZL ENERGIA ATOM; XEROX CORP; KERNFORSCHUNGSANLAGE; SOLAREX CORP; ADV PHOTOVOLTAIC SYSTS; USSC, pp. 219-224, 1993.
"Full-chip verification of UDSM designs",
1998 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN - DIGEST OF TECHNICAL PAPERS, 1515 BROADWAY, NEW YORK, NY 10036-9998 USA, IEEE, Circuits & Syst Soc; IEEE, Comp Soc; Assoc Comp Machinery, Special Interest Grp Design Autmat, pp. 453-460, 1998.
Abstract
"Raman spectroscopy of B-doped microcrystalline silicon films",
Thin Solid Films, vol. 427, no. 1-2, PO BOX 564, 1001 LAUSANNE, SWITZERLAND, European Mat Res Soc, pp. 266-269, MAR 3, 2003.
Abstract
"Structural characterization of a-Si : C : H alloys prepared by dc sputtering",
Journal of Non-Crystanlline Solids, vol. 299, no. Part B, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, ELSEVIER SCIENCE BV, pp. 891-895, APR 1, 2002.
Abstract
"Microstructure characterization in dc sputtered a-SiC : H films by inert gas effusion measurements",
Journal of Non-Crystanlline Solids, vol. 338, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, ELSEVIER SCIENCE BV, pp. 517-520, JUN 15, 2004.
Abstract
"THE INFLUENCE OF SPATIALLY NON-UNIFORM DENSITY-OF-STATE DISTRIBUTIONS ON THE CHARACTERISTICS OF A-SI-H THIN-FILM TRANSISTORS",
Philosophical Magazine B-Physics of Condensed Matter Statistical Mechanics Electronic Optical and Magnetic Properties, vol. 61, no. 2, ONE GUNDPOWDER SQUARE, LONDON, ENGLAND EC4A 3DE, TAYLOR & FRANCIS LTD, pp. 263-276, FEB, 1990.
"BENCHMARK CIRCUITS FOR MIXED-MODE SIMULATORS",
PROCEEDINGS OF THE IEEE 1994 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 345 E 47TH ST, NEW YORK, NY 10017, IEEE ELECTRON DEVICES SOC; IEEE SOLID STATE CIRCUITS COUNCIL, pp. 441-448, 1994.
"Axisymmetric stagnation-point flow and heat transfer of a viscous fluid on a moving cylinder with time-dependent axial velocity and uniform transpiration",
Journal of Fluids Engineering-Transactions of the ASME, vol. 126, no. 6, THREE PARK AVE, NEW YORK, NY 10016-5990 USA, ASME-AMER SOC MECHANICAL ENG, pp. 997-1005, NOV, 2004.
Abstract
"NEW MACRO MODEL FOR ZENERS",
IEEE Circuits and Devices Magazine, vol. 9, no. 2, 345 E 47TH ST, NEW YORK, NY 10017-2394, IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, pp. 7-11, MAR, 1993.
"The influence of boron concentrations on structural properties in disorder silicon films",
Applied Surface Science, vol. 254, no. 2, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, ELSEVIER SCIENCE BV, pp. 580-585, SEP 15, 2007.
Abstract
"Adaptive compensation of RF front-end nonidealities in direct conversion receivers",
IEEE Transactions on Circuits and Systems II-Express Briefs, vol. 55, no. 4, pp. 354–358, 2008.
Abstract
"Axisymmetric stagnation - Point flow and heat transfer of a viscous fluid on a rotating cylinder with time-dependent angular velocity and uniform transpiration",
Journal of Fluids Engineering-Transactions of the ASME, vol. 129, no. 1, THREE PARK AVE, NEW YORK, NY 10016-5990 USA, ASME-AMER SOC MECHANICAL ENG, pp. 106-115, JAN, 2007.
Abstract
