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"Amorphous silicon detector and thin film transistor technology for large-area imaging of X-rays",
Microelectronics Journal, vol. 31, no. 11-12: Elsevier, pp. 883–891, 2000.
"Amorphous silicon image sensor technology",
PROCEEDING OF THE TENTH INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES, VOLS I AND II, vol. 3975, no. Part 1&2, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA, Defence Res & Dev Org; Minist Informat Technol; Council Sci & Indust Res; Dept Space; Int Soc Opt Engn; Abdus Salam Int Ctr Theoret Phys; IEEE Electron Device Soc; Semiconduct Complex Ltd; Philips, India Ltd; Karl Suss GmbH; Leica Microsyst Lithogr Ltd; E, pp. 691-698, 2000.
Abstract
"Thin film imaging technology on glass and plastic",
Microelectronics, 2000. ICM 2000. Proceedings of the 12th International Conference on, pp. 11 -14, 2000.
Abstract
